Portable X-ray Residual Stress Measurement Device μ-X360J
Anyone, anywhere, can measure it immediately.
【Features】 This device is the world's first successful commercialization of the cosα method, achieving compactness, lightweight design, high speed, high precision, and low cost. It complies with the "Standard for X-ray Stress Measurement Method using the cosα Method" established by the Japan Society for Materials Science. - It can measure residual stress, half-value width, and residual austenite. - It can capture all diffraction rings in two dimensions. - It allows for the examination of crystal-level information such as coarse crystals and orientation. - It is safe due to its low output (30kV, 1.6mA). - The setup is easy, enabling anyone to perform accurate measurements. - Users can replace the X-ray tube, allowing for the measurement of various materials with a single device (Cr, V, Mn, Cu, Co). - Its compact and lightweight design makes it easy to transport, allowing for measurements in various locations. - It can be used in places without power supply by utilizing a battery.
- Company：パルステック工業
- Price：Other
